Reliable static elimination is possible in wafer testing environments by installing a feedback sensor near the target to enable constant monitoring of the target area.
Static electricity can be eliminated quickly over a wide area. Recording static elimination results during peeling makes it possible to identify the cause of problems.
Using high-speed static elimination to prevent discharges during die releasing helps reduce maintenance that would otherwise be necessary with conventional devices.
With a high-performance ion balance of ±1 V, the device can be used safely in any semiconductor manufacturing site. Previous static elimination results can also be checked to identify affected periods in the event of a problem.
Airless and energy-saving ionizers help reduce air consumption in a factory while ensuring advanced static elimination performance.
Installing ionizers in air shower rooms—where the risk of introducing foreign particles into a clean room is highest—helps improve dust removal effectiveness.
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